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ECRIS plasma spectroscopy with a high resolution spectrometer

2020

Electron Cyclotron Resonance Ion Source (ECRIS) plasmas contain high-energy electrons and highly charged ions implying that only noninvasive methods such as optical emission spectroscopy are reliable in their characterization. A high-resolution spectrometer (10 pm FWHM at 632 nm) enabling the detection of weak emission lines has been developed at University of Jyväskylä, Department of Physics (JYFL) for this purpose. Diagnostics results probing the densities of ions, neutral atoms, and the temperature of the cold electron population in the JYFL 14 GHz ECRIS are described. For example, it has been observed that the cold electron temperature drops from 40 eV to 20 eV when the extraction volta…

Materials scienceIon beamspektroskopiaelectron impact ionizationphotomultipliers01 natural sciences7. Clean energyElectron cyclotron resonance010305 fluids & plasmasIonion sourcesPhysics::Plasma Physics0103 physical sciencesEmission spectrumInstrumentation010302 applied physicsplasma confinementamplitude modulationPlasmaIon sourceemission spectroscopymonochromatorsdoppler effectElectron temperatureAtomic physicsDoppler broadeningplasma spectroscopy
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