Search results for "photoemission electron"
showing 10 items of 55 documents
Magnetic Domain Imaging of Thin Metallic Layers Using PEEM
2001
Photoemission electron microscopy (PEEM) in combination with resonant excitation by circularly polarized soft X-rays has proven to be a powerful analytical tool for the study of magnetic microstructures and multilayers. In this type of electron microscope the lateral intensity distribution of the emitted low-energy secondary or photoelectrons is imaged by an electron-optical system. Owing to its fast parallel image acquisition, its wide zoom range allowing fields of view from almost 1 mm down to a few µm combined with a high base-resolution of the order of 20 nm, the method offers a unique access to many aspects in surface and thin film magnetism on the mesoscopic length scale. Magnetic con…
Characterisation of structured thin films made from complex materials by photoabsorption spectromicroscopy
1998
Al3 and YBa2Cu3O7/PrBa2Cu3O7. To investigate devices built from these complex materials we applied element-sensitive photoemission electron microscopy (PEEM). Information about the chemical composition of the imaged sample can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired microscopic images using photon energies near and at the edges. Such images give the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of the true secondary electrons in selected spots during a sweep of the photon energy. The main aim of our work was to observe oxygen-related defects and changes in the c…
Energy- and time-resolved microscopy using PEEM: recent developments and state-of-the-art
2008
Two novel methods of spectroscopic surface imaging are discussed, both based on photoemission electron microscopy PEEM. They are characterised by a simple electron-optical set up retaining a linear column. An imaging high-pass energy filter has been developed on the basis of lithographically-fabricated microgrids. Owing to a mesh size of only 7μm, no image distortions occur. The present energy resolution is 70 meV. The second approach employs time-of-flight energy dispersion and time-resolved detection using a Delayline Detector. In this case, the drift energy and the time resolution of the detector determine the energy resolution. The present time resolution is 180 ps, giving rise to an en…
Magnetization dynamics in microscopic spin-valve elements: Shortcomings of the macrospin picture
2007
We have studied ultrafast magnetodynamics in micropatterned spin-valve structures using time-resolved x-ray photoemission electron microscopy combined with x-ray magnetic circular dichroism. Exciting the system with ultrafast field pulses of $250\phantom{\rule{0.3em}{0ex}}\mathrm{ps}$ width, we find the dynamic response of the free layer to fall into two distinctly different contributions. On the one hand, it exhibits localized spin wave modes that strongly depend on the shape of the micropattern. A field pulse applied perpendicular to the exchange bias field along the diagonal of a square pattern leads to the excitation of a standing spin wave mode with two nodes along the field direction.…
Accessing fast magnetization dynamics by XPEEM: Status and perspectives
2006
Abstract Being already well established as a versatile technique for high-resolution static magnetic domain imaging, X-ray photoemission electron microscopy (XPEEM) is now also capturing the field of time-resolved magnetic investigations. Using appropriate operation modes at synchrotron radiation sources, a time resolution of 10 ps and less can be achieved in recent magnetodynamics studies, giving access even to phenomena involving precessional processes.
Magnetization changes visualized using photoemission electron microscopy
2004
Abstract Photoemission electron microscopy was used to visualize the motion of magnetic domains on a sub-nanosecond timescale. The technique exploits the imaging of magnetic domains using soft X-ray circular dichroism, with the special feature that the instrument utilizes a fast image acquisition system with intrinsic 125 ps time resolution. The overall time resolution used is about 500 ps. Different domains and domain movements have been observed in lithographically-produced Permalloy structures on a copper microstrip-line. A current pulse of I=0.5 A with rise times of about 300 ps switched the Permalloy islands from a Landau-Lifshitz type domain configuration into metastable s-state domai…
Robustness of plasmonic angular momentum confinement in cross resonant optical antennas
2015
Using a combination of photoemission electron microscopy and numerical simulations, we investigated the angular moment transfer in strongly enhanced optical near-fields of artificially fabricated optical antennas. The polarization dependence of the optical near-field enhancement has been measured in a maximum symmetric geometry, i.e., excitation by a normal incident planar wave. Finite-difference time-domain simulations for the realistic antenna geometries as determined by high-resolution electron microscopy reveal a very good agreement with experimental data. The agreement confirms that the geometrical asymmetries and inhomogeneities due to the nanoscale fabrication process preserve the ci…
Stroboscopic XMCD-PEEM Imaging
2007
Abstract This article summarizes recent results on magnetization dynamics obtained with time-resolved photoemission electron microscopy (PEEM) using X-ray magnetic circular dichroism as contrast mechanism. Time resolution is performed by a stroboscopic technique that is exclusively sensitive to reversible processes, but offers a very high time resolution only limited by the X-ray pulse width. A time resolution of 20 ps in combination with a lateral resolution of 100 nm has been achieved.
Spatially resolved observation of dynamics in electrical and magnetic field distributions by means of a delayline detector and PEEM
2005
Abstract Photoemission electron microscopy (PEEM) was exploited to observe the dynamics in local field distributions on microstrip-line devices with a best time resolution of 133 ps. A delayline detector system served as imaging unit capable of a time resolving data acquisition and processing. The setup can be operated at the resolution limit of the PEEM of about 20 nm while a continuously illuminating UV-lamp excites the photoelectrons in threshold photoemission. A pulsed photon source is not needed to obtain time resolved images, the time reference of the data acquisition was taken by a periodic signal (clock, here typ. 100 MHz) in phase with the pulse pattern applied to the microstrip-li…
Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations
2010
Abstract The present work enlightens the developments in time- and energy resolved photoemission electron microscopy over the past few years. We describe basic principles of the technique and demonstrate different applications. An energy- and time-filtering photoemission electron microscopy (PEEM) for real-time spectroscopic imaging can be realized either by a retarding field or hemispherical energy analyzer or by using time-of-flight optics with a delay line detector. The latter method has the advantage of no data loss at all as all randomly incoming particles are measured not only by position but also by time. This is of particular interest for pump–probe experiments in the femtosecond an…