A selective microscale x-ray fluorescence analyzing method for determination of trace elements

Abstract A new selective X-ray fluorescence analyzing method for trace element determination has been developed. In this method each trace element is measured independently. The excitation source is an X-ray tube that has a changeable anode and a variable high voltage. The exciting radiation is shaped with critical absorbers. The sample is viewed at backward angles through an absorber to reduce backscattered radiation. The estimated accuracy of this method is of the order of 10 per cent in thesub-ppm range of trace element concentration in organic samples. Measurement times are of the order of a few minutes.