6533b828fe1ef96bd1287a57

RESEARCH PRODUCT

A selective microscale x-ray fluorescence analyzing method for determination of trace elements

P. SuominenP. PuumalainenJ. HattulaH. Kalm

subject

RadiationTrace AmountsChemistrySpectrum AnalysisTrace elementAnalytical chemistryX-ray fluorescenceRadiationFluorescenceFluorescenceTrace ElementsAnodeNuclear Energy and EngineeringMethodsRadiology Nuclear Medicine and imagingEnvironmental PollutionMicroscale chemistryExcitation

description

Abstract A new selective X-ray fluorescence analyzing method for trace element determination has been developed. In this method each trace element is measured independently. The excitation source is an X-ray tube that has a changeable anode and a variable high voltage. The exciting radiation is shaped with critical absorbers. The sample is viewed at backward angles through an absorber to reduce backscattered radiation. The estimated accuracy of this method is of the order of 10 per cent in thesub-ppm range of trace element concentration in organic samples. Measurement times are of the order of a few minutes.

yearjournalcountryeditionlanguage
1973-11-01The International Journal of Applied Radiation and Isotopes
https://doi.org/10.1016/0020-708x(73)90087-2