0000000000025426

AUTHOR

Ivan Gueorguiev Ivanov

showing 1 related works from this author

Seed‐Layer‐Free Atomic Layer Deposition of Highly Uniform Al 2 O 3 Thin Films onto Monolayer Epitaxial Graphene on Silicon Carbide

2019

Atomic layer deposition (ALD) is the method of choice to obtain uniform insulating films on graphene for device applications. Owing to the lack of out-of-plane bonds in the sp(2) lattice of graphene, nucleation of ALD layers is typically promoted by functionalization treatments or predeposition of a seed layer, which, in turn, can adversely affect graphene electrical properties. Hence, ALD of dielectrics on graphene without prefunctionalization and seed layers would be highly desirable. In this work, uniform Al2O3 films are obtained by seed-layer-free thermal ALD at 250 degrees C on highly homogeneous monolayer (1L) epitaxial graphene (EG) (amp;gt;98% 1L coverage) grown on on-axis 4H-SiC(00…

SiCMaterials sciencePhysics::Opticslaw.inventionchemistry.chemical_compoundAtomic layer depositionlawLattice (order)MonolayerPhysics::Atomic and Molecular ClustersSilicon carbidePhysics::Chemical PhysicsThin filmCondensed Matter::Quantum Gasesatomic force microscopybusiness.industryAtomic force microscopyGrapheneMechanical EngineeringCondensed Matter Physicsepitaxial graphenechemistryMechanics of Materialsatomic layer depositionOptoelectronicsatomic force microscopy; atomic layer deposition; epitaxial graphene; SiCEpitaxial graphenebusinessDen kondenserade materiens fysikAdvanced Materials Interfaces
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