0000000000046656
AUTHOR
Nick Schiavon
Identification Techniques I
Infrared (IR) and Raman spectroscopy have a high potential for characterisation of material. Extensive series of wet chemical analysis may be substituted by a single spectroscopic measurement followed by detailed chemometric data evaluation. Topics of this chapter are: (i) basics of IR and Raman spectroscopy, (ii) the registration of “correct” spectra, and (iii) spectra evaluation. Dedicated applications in the area of conservation science are collected in separate chapters. The infrared (IR) spectrum is often called the fingerprint of a substance. An IR spectrum identifies a substance like a human fingerprint. Due to their origin the features of an IR spectrum are bands, not peaks. They in…
Multilayered samples reconstructed by measuring Kα/Kβ or Lα/Lβ X-ray intensity ratios by EDXRF
Abstract In this paper a general method based on energy-dispersive X-ray fluorescence (EDXRF) analysis has been tested to assess its possible use as a tool to reconstruct the structure and determine the thickness of two and/or multi-layered materials. The method utilizes the X-ray intensity ratios of Kα/Kβ or Lα/Lβ peaks (or the ratio of these peaks) for selected elements present in multi-layered objects of various materials (Au alloys, gilded Cu, gilded Ag, gilded Pb, Ag–Au Tumbaga, stone surfaces with protective treatments, Zn or Nickel plating on metals). Results show that, in the case of multi-layered samples, a correct calculation of the peak ratio (Kα /Kβ and/or Lα/Lβ) of relevant ele…