0000000000089570

AUTHOR

Ma Hongqiang

showing 1 related works from this author

Influence of titanium-substrate roughness on Ca–P–O thin films grown by atomic layer deposition

2013

Abstract Amorphous Ca–P–O films were deposited on titanium substrates using atomic layer deposition, while maintaining a uniform Ca/P pulsing ratio of 6/1 with varying number of atomic layer deposition cycles starting from 10 up to 208. Prior to film deposition the titanium substrates were mechanically abraded using SiC abrasive paper of 600, 1200, 2000 grit size and polished with 3 μm diamond paste to obtain surface roughness R rms values of 0.31 μm, 0.26 μm, 0.16 μm, and 0.10 μm, respectively. The composition and film thickness of as-deposited amorphous films were studied using Time-Of-Flight Elastic Recoil Detection Analysis. The results showed that uniform films could be deposited on ro…

Materials scienceta114Metals and Alloyschemistry.chemical_elementDiamondNanotechnologySurfaces and Interfacesengineering.materialSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsAmorphous solidElastic recoil detectionAtomic layer depositionchemistryMaterials ChemistrySurface roughnessengineeringAtomic ratioThin filmComposite materialta116TitaniumThin Solid Films
researchProduct