0000000000137750

AUTHOR

S. Sivananthan

showing 2 related works from this author

Material quality characterization of CdZnTe substrates for HgCdTe epitaxy

2005

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Material quality characterization of CdZnTe substrates for HgCdTe epitaxy

2006

Cd1−xZnxTe (CZT) substrates were studied to investigate their bulk and surface properties. Imperfections in CZT substrates affect the quality of Hg1−xCdxTe (MCT) epilayers deposited on them and play a role in limiting the performance of infrared (IR) focal plane arrays. CZT wafers were studied to investigate their bulk and surface properties. Transmission and surface x-ray diffraction techniques, utilizing both a conventional closed-tube x-ray source as well as a synchrotron radiation source, and IR transmission micro-spectroscopy, were used for bulk and surface investigation. Synchrotron radiation offers the capability to combine good spatial resolution and shorter exposure times than conv…

business.industryChemistryNeutron diffractionSynchrotron Radiation SourceSynchrotron radiationCondensed Matter PhysicsEpitaxySettore ING-INF/01 - ElettronicaCadmium telluride photovoltaicsElectronic Optical and Magnetic MaterialsOpticsMaterials ChemistryCadmium alloysCadmium tellurideGrain boundaryWaferElectrical and Electronic EngineeringbusinessMolecular beam epitaxyMolecular beam epitaxy
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