0000000000145542
AUTHOR
G Cappello
Gamma-ray irradiation tests on CCD and CMOS sensors used in imaging techniques
Technologically-enhanced electronic devices are used in various fields as space imaging or diagnostic techniques in medicine. The devices can be exposed to intense radiation fluxes over time which may impair the functioning of the same apparatus, in particular in space applications. In this paper we report the results of a gamma irradiation tests on imaging sensors simulating the space radiation over a long time period. Two types of sensors are taken into consideration: CCD (Charge-Coupled Device) sensors and CMOS based on technology MOS (Metal Oxide semiconductor) used for the realization of transistors widely used in consumer electronics. The devices are supplied by Techno System (Italy),…