0000000000147612
AUTHOR
Andrejs Tokmakov
showing 2 related works from this author
Review and comparison of experimental techniques used for determination of thin film electro-optic coefficients
2015
The results of electro-optic coefficient measurements performed with three commonly applied techniques used to assess electro-optic coefficients: the Mach–Zehnder, the Teng–Man, and the attenuated total reflectance technique are reported. It is shown that the signal obtained by the Mach–Zehnder and Teng–Man techniques is strongly influenced by the multiple internal reflection and piezo- and electrostrictive thickness change effects, which in our opinion have not been addressed sufficiently in the literature. A novel approach based on using Abeles matrix formalism is implemented for the retrieval of electro-optic coefficients from experimental data. The measurement results, errors, and compa…
Determination of refractive index of submicron-thick films using resonance shift in a four-layer slab waveguide
2017
The measurement of refractive index of very thin films at the order of ten to hundred nanometers is cumbersome and usually requires employing sophisticated techniques such as the spectral ellipsometry. In this paper we describe a simple contact method for measuring the refractive index of thin films. Here we have used the prism-coupling technique for characterizing samples prepared as four-layer slab waveguides. The waveguide resonance condition can be calculated by solving simple analytic transcendental equations for the slab waveguide. Then the captured mode position as a function of cladding thickness is used for probing the refractive index of cladding layer. We used indium-tin-oxide la…