0000000000173643
AUTHOR
M. Foucault
showing 2 related works from this author
Imaging of Located Buried Defects in Metal Samples by an Scanning Microwave Microscopy
2011
Abstract A non-destructive method is proposed to detect the located buried defects using scanning microwave microscopy. Based on the “skin effect”, our recent developments authorize 3D tomography with nanometric resolution. This technique associates the electromagnetic microwave measurement using a Vector Network Analyzer (VNA) with the nanometer-resolution positioning capabilities of an Atomic Force Microscope. At each used frequency, an incident electromagnetic wave is send to the sample and the reflected wave gives information on a specific depth layer in the material. With a large bandwidth of frequencies, a 3D tomography is allowed inside the material. With characteristic tools of nano…
Non-destructive technique to detect local buried defects in metal sample by scanning microwave microscopy
2012
International audience; Based on the skin effect, our recent developments using scanning microwave microscopy lead to propose a non-destructive method to detect located buried defect in metal samples like stainless steel. A 3D tomography is possible by taking advantage of microwave measurement, using a vector network analyzer in bandwidth frequencies, and the nanometer resolution positioning capabilities with atomic force microscopy. At each used frequency, an incident electromagnetic wave is sent to the sample and the reflected wave gives information on a specific depth layer in the material. With diagnostic tools of nanotechnologies (SEM. AFM, etc.), different stainless steel samples (fro…