6533b826fe1ef96bd1284899
RESEARCH PRODUCT
Non-destructive technique to detect local buried defects in metal sample by scanning microwave microscopy
Eric LesniewskaEric BourillotCédric PlassardM. FoucaultO. CalonneJérôme Rossignolsubject
Materials scienceAnalytical chemistry02 engineering and technology01 natural sciencesElectromagnetic radiationMetalNon destructive0103 physical sciencesMicroscopyElectrical and Electronic EngineeringATOMIC FORCE MICROSCOPE010306 general physicsInstrumentationbusiness.industryMetals and Alloys021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialsvisual_artvisual_art.visual_art_mediumOptoelectronicsSkin effectNanometreTomography0210 nano-technologybusinessMicrowavedescription
International audience; Based on the skin effect, our recent developments using scanning microwave microscopy lead to propose a non-destructive method to detect located buried defect in metal samples like stainless steel. A 3D tomography is possible by taking advantage of microwave measurement, using a vector network analyzer in bandwidth frequencies, and the nanometer resolution positioning capabilities with atomic force microscopy. At each used frequency, an incident electromagnetic wave is sent to the sample and the reflected wave gives information on a specific depth layer in the material. With diagnostic tools of nanotechnologies (SEM. AFM, etc.), different stainless steel samples (from Areva NP) presenting local buried defects are studied. The materials used in this study are conventional stainless steels like a 304 stainless steel which is the most versatile and widely used stainless steel. The results of the tomography applied on these samples are in accordance with the skin effect equation.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2012-10-01 | Sensors and Actuators A: Physical |