0000000000015460
AUTHOR
Cédric Plassard
showing 6 related works from this author
Imaging of Located Buried Defects in Metal Samples by an Scanning Microwave Microscopy
2011
Abstract A non-destructive method is proposed to detect the located buried defects using scanning microwave microscopy. Based on the “skin effect”, our recent developments authorize 3D tomography with nanometric resolution. This technique associates the electromagnetic microwave measurement using a Vector Network Analyzer (VNA) with the nanometer-resolution positioning capabilities of an Atomic Force Microscope. At each used frequency, an incident electromagnetic wave is send to the sample and the reflected wave gives information on a specific depth layer in the material. With a large bandwidth of frequencies, a 3D tomography is allowed inside the material. With characteristic tools of nano…
Nanoscale Investigation of Particle Interactions at the Origin of the Cohesion of Cement
2007
International audience
Non-destructive technique to detect local buried defects in metal sample by scanning microwave microscopy
2012
International audience; Based on the skin effect, our recent developments using scanning microwave microscopy lead to propose a non-destructive method to detect located buried defect in metal samples like stainless steel. A 3D tomography is possible by taking advantage of microwave measurement, using a vector network analyzer in bandwidth frequencies, and the nanometer resolution positioning capabilities with atomic force microscopy. At each used frequency, an incident electromagnetic wave is sent to the sample and the reflected wave gives information on a specific depth layer in the material. With diagnostic tools of nanotechnologies (SEM. AFM, etc.), different stainless steel samples (fro…
Detection of defects buried in metallic samples by scanning microwave microscopy
2011
This paper reports the local detection of buried calibrated metal defects in metal samples by a new experimental technique, scanning microwave microscopy. This technique combines the electromagnetic measurement capabilities of a microwave vector network analyzer with the subnanometer-resolution capabilities of an atomic force microscope. The network analyzer authorizes the use of several frequencies in the range 1--6 GHz, allowing three-dimensional tomographical investigation, which is useful for the detection of bulk defects in metal materials.
Facile approaches to build ordered amphiphilic tris(phthalocyaninato) europium triple-decker complex thin films and their comparative performances in…
2010
Solution processed thin films of an amphiphilic tris(phthalocyaninato) rare earth triple-decker complex, Eu(2)[Pc(15C5)(4)](2)[Pc(OC(10)H(21))(8)], have been prepared from three different methods: self-assembly (SA) annealed in solvent vapor, quasi-Langmuir-Shäfer (QLS) and drop casting methods. In particular, we successfully developed a simple QLS process for fabricating ordered multilayers with a good thickness control. The films prepared from three different methods were characterized by a wide range of methods including electronic absorption spectra, IR, X-ray diffraction, atomic force microscopy (AFM), and current-voltage (I-V) measurements. J-type aggregates have been formed with the …
High-resolution characterization of the diffusion of light chemical elements in metallic components by scanning microwave microscopy
2014
International audience; An original sub-surface, high spatial resolution tomographic technique based on scanning microwave microscopy (SMM) is used to visualize in-depth materials with different chemical compositions. A significant phase difference in SMM between aluminum and chromium buried patterns has been observed. Moreover this technique was used to characterize a solid solution of a light chemical element (oxygen) in a metal lattice (zirconium). The large solubility of the oxygen in zirconium leads to modifications of the properties of the solid solution that can be measured by the phase shift signal in the SMM technique. The signal obtained in cross-section of an oxidized Zr sample s…