0000000000184232
AUTHOR
Francesco La Rosa
Impact of the erase algorithms on flash memory lifetime
This paper presents a comparative study on the impact of the erase algorithm on flash memory lifetime, to demonstrate how the reduction of overall stress, suffered by memories, will increase their lifetime, thanks to a smart management of erase operations. To this purpose a fixed erase voltage, equal to the maximum value and the maximum time-window, was taken as the reference test; while an algorithm with adaptive voltage levels and the same overall time-window was designed and implemented in order to compare their experimental results. This study was carried out by using an innovative Automated Test Equipment, named Portable-ATE, tailored for Memory Test Chip and designed for performance e…
Italian cancer figures, report 2013: Multiple tumours
This collaborative study, based on data collected by the network of Italian association of cancer registries (AIRTUM), provides updated estimates on the incidence risk of multiple primary cancer (MP). The objective is to highlight and quantify the bidirectional associations between different oncological diseases. The quantification of the excess or decreased risk of further cancers in cancer patients, in comparison with the general population, may contribute to understand the aetiology of cancer and to address clinical follow-up.Data herein presented were provided by AIRTUM population-based cancer registries, which cover nowadays 48% of the Italian population. This monograph utilizes the AI…
Performance evaluation of non volatile memories with a low cost and portable automatic test equipment
This paper presents a versatile and portable test equipment, called portable ATE for research and development of non-volatile memories functionalities. The system is based on STM32-NUCLEO assembled with a custom designed daughter board, in order to host non-volatile memories test-chips, to manage the needed power supplies and generate suitable signals stimuli for correct operations. The system is controlled and programmed by a personal computer, via USB interface. In particular the system can perform: memory reading, writing and erasing, with settings flexibility on time and voltage levels; Electrical Stress Tests (Drain, Gate and Bulk Stress); Cycling Tests; debugging algorithms (erase or …