0000000000191541
AUTHOR
Jürgen Kirschner
Correction of the deterministic part of space–charge interaction in momentum microscopy of charged particles
Abstract Ultrahigh spectral brightness femtosecond XUV and X-ray sources like free electron lasers (FEL) and table-top high harmonics sources (HHG) offer fascinating experimental possibilities for analysis of transient states and ultrafast electron dynamics. For electron spectroscopy experiments using illumination from such sources, the ultrashort high-charge electron bunches experience strong space–charge interactions. The Coulomb interactions between emitted electrons results in large energy shifts and severe broadening of photoemission signals. We propose a method for a substantial reduction of the effect by exploiting the deterministic nature of space–charge interaction. The interaction…
Quantitative spin polarization analysis in photoelectron emission microscopy with an imaging spin filter.
Abstract Using a photoelectron emission microscope (PEEM), we demonstrate spin-resolved electron spectroscopic imaging of ultrathin magnetic Co films grown on Cu(100). The spin-filter, based on the spin-dependent reflection of low energy electrons from a W(100) crystal, is attached to an aberration corrected electrostatic energy analyzer coupled to an electrostatic PEEM column. We present a method for the quantitative measurement of the electron spin polarization at 4×10 3 points of the PEEM image, simultaneously. This approach uses the subsequent acquisition of two images with different scattering energies of the electrons at the W(100) target to directly derive the spin polarization witho…