6533b836fe1ef96bd12a0a6c
RESEARCH PRODUCT
Quantitative spin polarization analysis in photoelectron emission microscopy with an imaging spin filter.
Pavel LushchykKaterina MedjanikChristian TuscheMartin EllguthA. KrasyukJürgen KirschnerJürgen KirschnerAimo WinkelmannGerd SchönhenseD. Kutnyakhovsubject
Spectrum analyzerMicroscopeSpin polarizationChemistryScatteringElectric potential energyElectronPolarization (waves)Atomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionlawAtomic physicsElectron microscopeInstrumentationdescription
Abstract Using a photoelectron emission microscope (PEEM), we demonstrate spin-resolved electron spectroscopic imaging of ultrathin magnetic Co films grown on Cu(100). The spin-filter, based on the spin-dependent reflection of low energy electrons from a W(100) crystal, is attached to an aberration corrected electrostatic energy analyzer coupled to an electrostatic PEEM column. We present a method for the quantitative measurement of the electron spin polarization at 4×10 3 points of the PEEM image, simultaneously. This approach uses the subsequent acquisition of two images with different scattering energies of the electrons at the W(100) target to directly derive the spin polarization without the need of magnetization reversal of the sample.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2012-12-14 | Ultramicroscopy |