0000000000194858
AUTHOR
S. I. Protsenko
showing 3 related works from this author
Morphological and magnetic analysis of Fe nanostructures on W(110) by using scanning tunneling microscopy and Lorentz microscopy
2016
Abstract We investigated morphological features and magnetic properties of epitaxial Fe nanostructures (films, stripes and nanoparticles) on a W(110) surface with monoatomic steps preferentially along the direction. The nanostructures were prepared in ultra-high vacuum by using electron-beam evaporation and subsequent annealing at different temperatures. Scanning tunneling microscopy measurements in-situ revealed elongated Fe nanostructures with aspect ratios of up to . The observable shape and orientation (along or perpendicular to the monoatomic steps of the substrate) of the nanostructures depended substantially on the preparation parameters. By capping the system with 7 monolayers of Pt…
Transmission electron microscopy investigation of oxidation of (110)NiAl single crystal with wedge-shaped profile
2016
Abstract Low energy electron diffraction (LEED), high resolution transmission electron microscopy (HRTEM), energy-dispersive X-ray (EDX), and electron energy loss spectroscopy (EELS) investigations of oxidation processes in (110)NiAl single crystal of wedge like shape, i.e., on the sample’s areas of different thickness, were carried out. It was found that in the result of several cycles of ion etching, annealing and oxidation the upper layer of (110)NiAl is enriched with Ni. With the increase of Ni concentration from 50 to 100 at. %, the stoichiometry of the near surface area changes and the new phases of Ni3Al and Ni with Al doping are formed one after another. Up to Ni content of 75 at. %…
Magneto-optical properties of two-layer film systems based on Fe and Cr
2020
The results of the investigation of two-layer Fe/Cr systems using the magneto-optical Kerr effect (MOKE) are presented in this paper. The samples were obtained by thermal evaporation in a vacuum with a thickness of individual layers from 2 nm to 50 nm. It was found that the presence of the Cr layer significantly affects the values of the coercivity and the Kerr angle. At a substrate temperature of 450 K, the value of the coercivity is almost half that of the same sample obtained at room temperature of the substrate. In addition, the influence of the order of deposition of layers, as well as the effect of a thin gold protective layer on the parameters measured by the Kerr method, is shown. …