0000000000240332

AUTHOR

M. Gomez Rodroiguez De La Paz

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Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

2009

For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity.

PhysicsNuclear and High Energy PhysicsPhotomultiplierPhysics::Instrumentation and Detectorsbusiness.industryRadiationParticle detectorOpticsSilicon photomultiplierElectron beam processingRadiation damageNuclear ExperimentbusinessInstrumentationMicrotronNoise (radio)Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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