6533b7d4fe1ef96bd126313a

RESEARCH PRODUCT

Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

B. S. SchlimmeL. NungesserR. BöhmU. MüllerC. J. YoonTh. WalcherM. O. DistlerM. Gomez Rodroiguez De La PazJan C. BernauerPatrick AchenbachM. WeinrieferS. Sánchez MajosC. Ayerbe GayosoJ. PochodzallaHarald Merkel

subject

PhysicsNuclear and High Energy PhysicsPhotomultiplierPhysics::Instrumentation and Detectorsbusiness.industryRadiationParticle detectorOpticsSilicon photomultiplierElectron beam processingRadiation damageNuclear ExperimentbusinessInstrumentationMicrotronNoise (radio)

description

For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity.

yearjournalcountryeditionlanguage
2009-04-01Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
https://doi.org/10.1016/j.nima.2009.01.176