Experimental Equipment for Studying the Residual Stresses Developed During High Temperature Reactions by X-Ray Diffraction

This paper describes a device dedicated to studyng, by X-ray diffraction the residual stresses developed on surface samples as a function of temperature and atmosphere conditions. The setup consists of : a.) an horizontal axis goniometer which allows the programmed positionning of the sealed X-ray source and of the linear detector. b.) a high temperature controlled atmosphere chamber Particular attention has been paid to the thermal stability up to 1200°C and the accurate position on the sample.

Correlation Between Structure and Hydriding Behaviours in Laves Phases: Zr(M x Cr1−x )2, M = Fe, Ni*

Conception d'une chambre de diffraction RX haute température pour l'étude de l'adsorption d'un gaz par un solide sous haute pression

Le caractere original et innovateur de la chambre d'analyse qui est presentee dans ce travail repose sur son champ d'utilisation large, en particulier dans le domaine de l'adsorption sous haute pression d'un gaz condensable. Cette chambre qui a ete specialement concue au Laboratoire de Recherches sur la Reactivite des Solides de l'Universite de Bourgogne est susceptible d'operer dans des domaines etendus de pression et de temperature, respectivement (10 -4 -10 4 ) hPa et (20 - 350) °C. Un doigt de gant en beryllium monte sur un passage electrique assure l'etancheite de l'enceinte reactionnelle; l'echantillon est chauffe par conduction. La chambre qui est placee dans une enceinte externe (eq…

Residual Stresses and Reactivity of Solids. Determination and Part Plaid in the Reaction Mechanisms

Improvement of the MgH2 Formation-Decomposition Reaction: Kinetic Study of the CeMg11Ni System

In Situ Determination of the Residual Stress Field Induced by Air Oxidation, up to 1000 °C, in a 20% Cr 5% Al Ferritic Steel, by X-Ray Diffraction