6533b7d4fe1ef96bd1263376
RESEARCH PRODUCT
Experimental Equipment for Studying the Residual Stresses Developed During High Temperature Reactions by X-Ray Diffraction
Frédéric BernardE. ScioraN. Gerardsubject
010302 applied physicsDiffractionControlled atmosphereChemistrybusiness.industryDetectorGeneral Physics and Astronomy02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesAtmosphereOpticsResidual stressGoniometer[PHYS.HIST]Physics [physics]/Physics archives0103 physical sciencesX-ray crystallographyThermal stability0210 nano-technologybusinessdescription
This paper describes a device dedicated to studyng, by X-ray diffraction the residual stresses developed on surface samples as a function of temperature and atmosphere conditions. The setup consists of : a.) an horizontal axis goniometer which allows the programmed positionning of the sealed X-ray source and of the linear detector. b.) a high temperature controlled atmosphere chamber Particular attention has been paid to the thermal stability up to 1200°C and the accurate position on the sample.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1996-07-01 |