0000000000243932

AUTHOR

Laura Mercadé

0000-0002-4994-7727

showing 2 related works from this author

Electron Emission of Pt: Experimental Study and Comparison With Models in the Multipactor Energy Range

2016

Experimental data of secondary emission yield (SEY) and electron emission spectra of Pt under electron irradiation for normal incidence and primary energies lower than 1 keV are presented. Several relevant magnitudes, as total SEY, elastic backscattering probability, secondary emission spectrum, and backscattering coefficient, are given for different primary energies. These magnitudes are compared with theoretical or semiempirical formulas commonly used in the related literature.

Secondary electron emissionBackscatterAstrophysics::High Energy Astrophysical PhenomenaCleaningElectronSecondary emission yield (SEY01 natural sciencesElectrostatic measurements010305 fluids & plasmasBackscattering coefficientBackscatterEnergy measurementElectron emission0103 physical sciencesElectron beam effectsTEORIA DE LA SEÑAL Y COMUNICACIONESElectron beam processingEmission spectrumElectrical and Electronic EngineeringElastic backscattering probabilityElectron emission spectraMultipactor energy rangePlatinum010302 applied physicsRange (particle radiation)ChemistrySecondary emission yield (SEY)Secondary emission spectrum (SES)PtElectron irradiationCurrent measurementElectronic Optical and Magnetic MaterialsElectron backscatteringSecondary emission yieldSecondary emissionYield (chemistry)Backscattered electronsDistortion measurementAtomic physicsEnergy (signal processing)Multipactor
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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

2018

[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

010302 applied physicsMultipactor effectNuclear and High Energy PhysicsWaveguide (electromagnetism)Materials scienceDielectricCondensed Matter Physics01 natural sciencesSecondary electrons010305 fluids & plasmasCharacterization (materials science)Computational physicsSecondary electron emission (SEE)Secondary emission0103 physical sciencesRadio frequencyTEORIA DE LA SEÑAL Y COMUNICACIONESElectron beam processingEquivalent circuitMultipactor effectSecondary electron yield
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