6533b7d5fe1ef96bd1264789

RESEARCH PRODUCT

Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

David Banon-caballeroAlfredo SeguraJuan M. SocuellamosE.i. RakovaJuan F. Sánchez-royoLaura MercadéV. E. SemenovRafael MataDavid RabosoVicente E. BoriaBenito Gimeno

subject

010302 applied physicsMultipactor effectNuclear and High Energy PhysicsWaveguide (electromagnetism)Materials scienceDielectricCondensed Matter Physics01 natural sciencesSecondary electrons010305 fluids & plasmasCharacterization (materials science)Computational physicsSecondary electron emission (SEE)Secondary emission0103 physical sciencesRadio frequencyTEORIA DE LA SEÑAL Y COMUNICACIONESElectron beam processingEquivalent circuitMultipactor effectSecondary electron yield

description

[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

yearjournalcountryeditionlanguage
2018-04-01
10.1109/tps.2018.2809602http://hdl.handle.net/10251/121371