0000000000261268

AUTHOR

E.i. Rakova

showing 2 related works from this author

Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

2018

[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

010302 applied physicsMultipactor effectNuclear and High Energy PhysicsWaveguide (electromagnetism)Materials scienceDielectricCondensed Matter Physics01 natural sciencesSecondary electrons010305 fluids & plasmasCharacterization (materials science)Computational physicsSecondary electron emission (SEE)Secondary emission0103 physical sciencesRadio frequencyTEORIA DE LA SEÑAL Y COMUNICACIONESElectron beam processingEquivalent circuitMultipactor effectSecondary electron yield
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Enhancement of the Multipactor Threshold Inside Nonrectangular Iris

2018

Multipactor breakdown is studied inside the capacitive iris of a rectangular waveguide with a skewed slot along its longitudinal cross section. Both the iris length and height are assumed to be small compared to the electromagnetic wavelength. Therefore, the quasi-static approximation is applied so as to describe the RF field distribution inside the iris gap, whereas a 2-D model is used to analyze the electron motion. The peculiarities of RF field structure are studied using the conformal mapping approach, which shows that the electric field lines can be approximated by circular arcs when the iris length is much larger than its height. The electron motion inside the iris gap is analyzed usi…

010302 applied physicsPhysicsField linebusiness.industryField effectConformal mapElectron01 natural sciences010305 fluids & plasmasElectronic Optical and Magnetic Materials[SPI.TRON]Engineering Sciences [physics]/ElectronicsCross section (physics)Wavelengthmedicine.anatomical_structureOptics0103 physical sciencesmedicineRadio frequencyElectrical and Electronic EngineeringIris (anatomy)businessComputingMilieux_MISCELLANEOUS
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