0000000000261268
AUTHOR
E.i. Rakova
Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models
[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.
Enhancement of the Multipactor Threshold Inside Nonrectangular Iris
Multipactor breakdown is studied inside the capacitive iris of a rectangular waveguide with a skewed slot along its longitudinal cross section. Both the iris length and height are assumed to be small compared to the electromagnetic wavelength. Therefore, the quasi-static approximation is applied so as to describe the RF field distribution inside the iris gap, whereas a 2-D model is used to analyze the electron motion. The peculiarities of RF field structure are studied using the conformal mapping approach, which shows that the electric field lines can be approximated by circular arcs when the iris length is much larger than its height. The electron motion inside the iris gap is analyzed usi…