0000000000247742

AUTHOR

A. Matilainen

showing 2 related works from this author

A study of solar thermal absorber stack based on CrAlSiNx/CrAlSiNxOy structure by ion beams

2019

Renewable energies are foreseen as a major energy resource for next generations. Among several energy sources and technologies available, Concentrated Solar Power (CSP) technology has a great potential, but it needs to be optimised, in particular to reduce the costs, with an increase of the operating temperature and long term stability. This goal can be achieved by tailoring the composition and multilayer structure of films. In this work we present and discuss the results obtained from solar absorber coatings based on nitride/oxynitride structures. A four-layer film structure, W/CrAlSiNx(HA)/CrAlSiNxOy(LA)/SiAlOx, was deposited on stainless steel substrates using magnetron sputtering deposi…

Nuclear and High Energy PhysicsMaterials scienceCrAlSiNx /CrAlSiNxOy02 engineering and technologyaurinkoenergia010402 general chemistry01 natural sciences7. Clean energyRutherford Backscattering Spectrometry (RBS)time of flight elastic recoil detection analysis (TOF-ERDA)Operating temperatureSputteringConcentrated solar power:Engenharia dos Materiais [Engenharia e Tecnologia]Thermal stabilityCrAlSiN /CrAlSiN O x x yInstrumentationpinnoitteetTime of flight Elastic Recoil Detection Analysis (TOF-ERDA)CrAlSiNx/CrAlSiNxOyScience & TechnologySolar selective absorberbusiness.industrySputteringSolar selective absorber ; Rutherford Backscattering Spectrometry (RBS) ; Time of flight Elastic Recoil Detection Analysis (TOF-ERDA) ; CrAlSiNx/CrAlSiNxOySputteringSputter deposition021001 nanoscience & nanotechnologyRutherford backscattering spectrometry0104 chemical sciencesElastic recoil detectionsolar selective absorberspektrometriaEngenharia e Tecnologia::Engenharia dos MateriaisOptoelectronicssputteringohutkalvot0210 nano-technologybusinessEnergy source
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Memory irradiation measurements for the European SMART-1 spacecraft

2005

Three different types of memory circuits, that are intended to be used on board of the European satellite SMART-1, have been radiation hardness tested according to ESA's specification. Since the satellite is equipped with an electric propulsion engine, the spacecraft will be exposed to radiation during a long time when passing the radiation belt of the Earth. A standard DRAM circuit from SAMSUNG will serve as building block of the mass memory of SMART-1, and has been tested for total dose and proton induced single event upset (SEU). The DRAM memory showed surprisingly good resistance against radiation. The proton SEU cross sections for the radiation tolerant SRAM and FIFO circuits have also…

EngineeringHardware_MEMORYSTRUCTURESSpacecraftFIFO (computing and electronics)business.industryElectrical engineeringHardware_PERFORMANCEANDRELIABILITYElectrically powered spacecraft propulsionSingle event upsetStatic random-access memorybusinessRadiation hardeningDramElectronic circuitRADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605)
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