0000000000255449
AUTHOR
D. P. Siddons
New results from testing of coplanar-grid CdZnTe detectors
New results from studies of coplanar-grid CdZnTe (CZT) detectors are presented. The coplanar-grid detectors were investigated by using a highly collimated X-ray beam available at Brookhaven's National Synchrotron Light Source and by applying a pulse-shape analysis. The coplanar-grid detector operates as a single-carrier device. Despite the fact that its operational principle is well known and has been investigated by many groups in the past, we found some new details that may explain the performance limits of these types of devices. The experimental results have been confirmed by extensive computer modeling.
High-energy X-ray diffraction and topography investigation of CdZnTe
High-energy transmission x-ray diffraction techniques have been applied to investigate the crystal quality of CdZnTe (CZT). CdZnTe has shown excellent performance in hard x-ray and gamma detection; unfortunately, bulk nonuniformities still limit spectroscopic properties of CZT detectors. Collimated high-energy x-rays, produced by a superconducting wiggler at the National Synchrotron Light Source’s X17B1 beamline, allow for a nondestructive characterization of thick CZT samples (2–3 mm). In order to have complete information about the defect distribution and strains in the crystals, two series of experiments have been performed. First, a monochromatic 67 keV x-ray beam with the size of 300×3…