0000000000255849

AUTHOR

J. Lundsgaard Hansen

Channeling and Radiation of Electrons in Silicon Single Crystals and Si1−xGexCrystalline Undulators

The phenomenon of channeling and the basic features of channeling radiation emission are introduced in a pedestrian way. Both, radiation spectra as well as dechanneling length measurements at electron beam energies between 195 and 855 MeV feature quantum state phenomena for the (110) planar potential of the silicon single crystals. Radiation from a crystalline undulator, produced at the Aarhus University (UAAR), has been investigated at the Mainz Microtron electron accelerator facility MAMI. The 4-period epitaxially grown strained layer Si1−xGex undulator had a period length λu = 9.9 μm. At a beam energy of 375 MeV a broad excess yield around the theoretically expected photon energy of 0.13…

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Radiation emission at channeling of electrons in a strained layer undulator crystal

Abstract Experiments have been performed at the Mainz Microtron MAMI to explore the radiation emission spectra from a crystalline undulator at electron beam energies of 270 and 855 MeV. The epitaxially grown graded composition strained layer Si 1 - x Ge x undulator had 4-period with a period length λ u = 9.9 μ m . Spectra taken at the beam energy of 270 MeV at channeling in the undulating (110) planes exhibit a broad excess yield around the theoretically expected photon energies of 0.069 MeV, as compared with a flat silicon reference crystal. Model calculations on the basis of synchrotron-like radiation emission from finite single arc elements, taking into account also coherence effects, su…

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