0000000000255967
AUTHOR
C.m. Schneider
Quantitative measurements of magnetic stray field dynamics of Permalloy particles in a photoemission electron microscopy
By example of a Permalloy particle (40 × 40 μm(2) size, 30 nm thickness) we demonstrate a procedure to quantitatively investigate the dynamics of magnetic stray fields during ultrafast magnetization reversal. The measurements have been performed in a time-resolving photoemission electron microscope using the X-ray magnetic circular dichroism. In the particle under investigation, we have observed a flux-closure-dominated magnetic ground structure, minimizing the magnetic stray field outside the sample. A fast magnetic field pulse introduced changes in the micromagnetic structure accompanied with an incomplete flux closure. As a result, stray fields arise along the edges of domains, which cau…
Time-resolved photoemission electron microscopy of magnetic field and magnetisation changes
Owing to its parallel image acquisition, photoemission electron microscopy is well suited for real-time observation of fast processes on surfaces. Pulsed excitation sources like synchrotron radiation or lasers, fast electric pulsers for the study of magnetic switching, and/or time-resolved detection can be utilised. A standard approach also being used in light optical imaging is stroboscopic illumination of a periodic (or quasi-periodic) process. Using this technique, the time dependence of the magnetic field in a pulsed microstrip line has been imaged in real time exploiting Lorentz-type contrast. Similarly, the corresponding field-induced changes in the magnetisation of cobalt microstruct…
Magnetization changes visualized using photoemission electron microscopy
Abstract Photoemission electron microscopy was used to visualize the motion of magnetic domains on a sub-nanosecond timescale. The technique exploits the imaging of magnetic domains using soft X-ray circular dichroism, with the special feature that the instrument utilizes a fast image acquisition system with intrinsic 125 ps time resolution. The overall time resolution used is about 500 ps. Different domains and domain movements have been observed in lithographically-produced Permalloy structures on a copper microstrip-line. A current pulse of I=0.5 A with rise times of about 300 ps switched the Permalloy islands from a Landau-Lifshitz type domain configuration into metastable s-state domai…
Magnetic Domain Imaging with a Photoemission Microscope
ABSTRACTPhotoelectron emission microscopy (PEEM) has proven to be a versatile analytical technique in surface science. When operated with circularly polarized light in the soft x-ray regime, however, photoemission microscopy offers a unique combination of magnetic and chemical information. Exploiting the high brilliance and circular polarization available at a helical undulator beamline, the lateral resolution in the imaging of magnetic domain structures may be pushed well into the sub-micrometer range. Using a newly designed photoemission microscope we show that under these circumstances not only domains, but also domain walls can be selectively investigated. The high sensitivity of the te…
Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis
Abstract Photoemission electron microscopy (PEEM) is widely used in combination with synchrotron sources as a powerful tool to observe chemical and magnetic properties of metal and semiconductor surfaces. Presently, the resolution limit of these instruments using soft-X-ray excitation is limited to about 50 nm, because of the chromatic aberation of the electron optics used. Various sophisticated approaches have thus been reported for enhancing the spatial resolution in photoemission electron microscopy. This work demonstrates the use of a simple imaging energy filter based on electron time-of-flight (ToF) selection. The spatial resolution could be improved dramatically, even though the inst…
Size dependence of magnetic domain patterns in exchange-biased Permalloy/NiO microstructures
The magnetic domain structure in Permalloy (Ni81Fe19) micropatterns (10?100??m) on NiO has been investigated by means of soft x-ray photoemission electron microscopy. The exchange anisotropy between the Ni81Fe19 patterns and the NiO layer results in the formation of complex domain structures which markedly differ from the simple Landau?Lifshitz configurations. The domain structures reflect the competition between the exchange anisotropy and the dipole?dipole interaction in a weakly coupled system. The observed domain structures change with the feature size, as the domain patterns lose complexity in the smaller structures.