Problems of electron detection in Depth-Selective Conversion Electron Mössbauer Spectroscopy

Applications of Depth-Selective Conversion Electron Mossbauer Spectroscopy (DCEMS) are limited by the long measuring times needed for collecting sufficient data statistics. To shorten the recording time, the background should be reduced and the detection efficiency for conversion electrons should be improved. For57Co/57Fe DCEMS, systematic studies were performed to investigate the origin, shape, and structure of the background components in DCEMS data distributions for various samples using channeltrons and low-noise scintillation counters as electron detectors.