0000000000337340

AUTHOR

Rune Holmstad

showing 1 related works from this author

Comparison of 3D structural characteristics of high and low resolution X-ray microtomographic images of paper

2005

The detailed 3D structure of paper was revealed applying both high and low resolution X-ray microtomography. The qualityof the two techniques with respect to resolution and volume size was compared by measuring various structural andtransport properties of the digital volumes.

Materials scienceOpticsImage qualitybusiness.industryLow resolutionX-rayMineralogyGeneral Materials ScienceForestrybusinessLattice boltzmann simulation
researchProduct