6533b7d9fe1ef96bd126c286
RESEARCH PRODUCT
Comparison of 3D structural characteristics of high and low resolution X-ray microtomographic images of paper
Urpo AaltosalmiMarkku KatajaØYvind Weiby GregersenAntti KoponenShri RamaswamyRune HolmstadA. Goelsubject
Materials scienceOpticsImage qualitybusiness.industryLow resolutionX-rayMineralogyGeneral Materials ScienceForestrybusinessLattice boltzmann simulationdescription
The detailed 3D structure of paper was revealed applying both high and low resolution X-ray microtomography. The qualityof the two techniques with respect to resolution and volume size was compared by measuring various structural andtransport properties of the digital volumes.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2005-08-01 |