0000000000358189

AUTHOR

G. Boivin

showing 1 related works from this author

OPTIMAL PATCH RESIDENCE TIME IN EGG PARASITOIDS:INNATE VERSUS LEARNED ESTIMATE OF PATCH QUALITY

2004

International audience

[SDV.OT]Life Sciences [q-bio]/Other [q-bio.OT][SDV.OT] Life Sciences [q-bio]/Other [q-bio.OT][ SDV.OT ] Life Sciences [q-bio]/Other [q-bio.OT]ComputingMilieux_MISCELLANEOUS
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