6533b7dafe1ef96bd126e86b

RESEARCH PRODUCT

OPTIMAL PATCH RESIDENCE TIME IN EGG PARASITOIDS:INNATE VERSUS LEARNED ESTIMATE OF PATCH QUALITY

G. BoivinXavier FauvergueE. Wajnberg

subject

[SDV.OT]Life Sciences [q-bio]/Other [q-bio.OT][SDV.OT] Life Sciences [q-bio]/Other [q-bio.OT][ SDV.OT ] Life Sciences [q-bio]/Other [q-bio.OT]ComputingMilieux_MISCELLANEOUS

description

International audience

https://hal.archives-ouvertes.fr/hal-00161181