0000000000370952

AUTHOR

R. Krutokhvostov

showing 2 related works from this author

SYNTHESIS AND CHARACTERIZATION OF SB-SUBSTITUTED (K0.5Na0.5)NbO3 PIEZOELECTRIC CERAMICS

2008

ABSTRACT Lead-free piezoelectric ceramics (K0.5Na0.5)(Nb1-xSbx)O3+0.5 mol.%MnO2, where x = 0 ÷ 0.10, with single phase structure and rhombohedral symmetry at room temperature were prepared by conventional ceramic technology. The optimal sintering temperatures of compositions were within 1100°–1140°C. MnO2 functions as a sintering aid and effectively improves the densification. The samples reached density from 4.26 g/cm3 for undoped (K0.5Na0.5)NbO3 to 4.40 g/cm3 for Mn/Sb5+ co-doped ceramics. The co-effects of MnO2 doping and Sb5+ substitution lead to significant improvement in dielectric and piezoelectric properties: e at the Tc increased from 6000 (KNN) to 12400 (x = 0.04), d33 = 92 ÷ 192 …

Materials scienceDopingAnalytical chemistrySinteringTrigonal crystal systemDielectricCondensed Matter PhysicsMicrostructurePiezoelectricityElectronic Optical and Magnetic MaterialsCharacterization (materials science)Control and Systems Engineeringvisual_artMaterials ChemistryCeramics and Compositesvisual_art.visual_art_mediumCeramicElectrical and Electronic EngineeringIntegrated Ferroelectrics
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Object size effect on the contact potential difference measured by scanning Kelvin probe method

2010

International audience; Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10-30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 m. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.

010302 applied physicsKelvin probe force microscopeScanning Hall probe microscopeMicroscopeChemistrybusiness.industry02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesSignalElectronic Optical and Magnetic Materialslaw.inventionScanning probe microscopyOpticslawElectric field0103 physical sciencesPhysical Sciences0210 nano-technologybusinessInstrumentationVolta potential
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