6533b830fe1ef96bd1296846
RESEARCH PRODUCT
Object size effect on the contact potential difference measured by scanning Kelvin probe method
E. TamanisAlexei KuzminI. MuzikanteR. KrutokhvostovBoris PolyakovI. Talesubject
010302 applied physicsKelvin probe force microscopeScanning Hall probe microscopeMicroscopeChemistrybusiness.industry02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesSignalElectronic Optical and Magnetic Materialslaw.inventionScanning probe microscopyOpticslawElectric field0103 physical sciencesPhysical Sciences0210 nano-technologybusinessInstrumentationVolta potentialdescription
International audience; Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10-30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 m. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2010-07-07 |