0000000000388664

AUTHOR

Hugo Bender

showing 2 related works from this author

Effect of Boron Doping on the Wear Behavior of the Growth and Nucleation Surfaces of Micro- and Nanocrystalline Diamond Films

2016

B-doped diamond has become the ultimate material for applications in the field of microelectromechanical systems (MEMS), which require both highly wear resistant and electrically conductive diamond films and microstructures. Despite the extensive research of the tribological properties of undoped diamond, to date there is very limited knowledge of the wear properties of highly B-doped diamond. Therefore, in this work a comprehensive investigation of the wear behavior of highly B-doped diamond is presented. Reciprocating sliding tests are performed on micro- and nanocrystalline diamond (MCD, NCD) films with varying B-doping levels and thicknesses. We demonstrate a linear dependency of the we…

wearMaterials sciencereciprocating slidingMaterial properties of diamondta221diamond filmsNucleation02 engineering and technologyengineering.material01 natural sciencesnucleation surfaceChemical-mechanical planarization0103 physical sciencesboron dopingGeneral Materials Scienceta116Elastic modulus010302 applied physicsta114MetallurgyDiamondTribology021001 nanoscience & nanotechnologyMicrostructureCarbon filmengineeringplanarization0210 nano-technologyACS Applied Materials & Interfaces
researchProduct

Irradiation-induced damage in porous low-k materials during low-energy heavy-ion elastic recoil detection analysis

2006

Abstract With the implementation of time-of-flight elastic recoil detection (ToF-ERD) for the analysis of thin films with high depth resolution using a standard ‘low-energy’ accelerator, routine application of ERD in semiconductor technology becomes possible. In case of irradiation-sensitive materials, like organosilicate low- k films, the energetic incident beam damages the sample during the measurement, resulting in loss of the lighter elements and, as a consequence, altering the sample composition. The ion beam induced damage is investigated for 19 F, 35 Cl, 63 Cu, 79 Br and 127 I beams at energies of 6–16 MeV and typical fluences for ERD analysis. By means of Fourier transform infrared …

Elastic recoil detectionNuclear and High Energy PhysicsIon beamInfraredChemistryAnalytical chemistryIrradiationFourier transform infrared spectroscopyThin filmSpectroscopyInstrumentationBeam (structure)Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
researchProduct