Three-dimensional subnanoscale imaging of unit cell doubling due to octahedral tilting and cation modulation in strained perovskite thin films

Determining the three-dimensional (3D) crystallography of a material with subnanometer resolution is essential to understanding strain effects in epitaxial thin films. A scanning transmission electron microscopy imaging technique is demonstrated that visualizes the presence and strength of atomic movements leading to a period doubling of the unit cell along the beam direction, using the intensity in an extra Laue zone ring in the back focal plane recorded using a pixelated detector method. This method is used together with conventional atomic resolution imaging in the plane perpendicular to the beam direction to gain information about the 3D crystal structure in an epitaxial thin film of La…