0000000000451402
AUTHOR
Martin Dubau
Growth of nano-porous Pt-doped cerium oxide thin films on glassy carbon substrate
Abstract Glassy carbon (GC) substrates were treated by the oxygen plasma over several periods of time. Scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy (AFM) study showed the dramatic influence of oxygen plasma on the morphology of glassy carbon. The treatment leads to the formation of nanostructured surface, which consists of well separated rod-like nanostructures oriented perpendicularly to the substrate surface. The surface roughness was found to increase with increasing treatment time. By using magnetron co-sputtering of platinum and cerium oxide we can prepare oxide layers continuously doped with Pt atoms during the growth. This tec…
Preparation of magnetron sputtered thin cerium oxide films with a large surface on silicon substrates using carbonaceous interlayers.
The study focuses on preparation of thin cerium oxide films with a porous structure prepared by rf magnetron sputtering on a silicon wafer substrate using amorphous carbon (a-C) and nitrogenated amorphous carbon films (CNx) as an interlayer. We show that the structure and morphology of the deposited layers depend on the oxygen concentration in working gas used for cerium oxide deposition. Considerable erosion of the carbonaceous interlayer accompanied by the formation of highly porous carbon/cerium oxide bilayer systems is reported. Etching of the carbon interlayer with oxygen species occurring simultaneously with cerium oxide film growth is considered to be the driving force for this effec…
Structural and Chemical Characterization of Cerium Oxide Thin Layers Grown on Silicon Substrate
In this study, we report transmission electron microscopy and electron energy loss spectroscopy study of cerium oxide thin layers deposited on silicon substrate. Transmission electron microscopy experiments have revealed the flat morphology of the deposited layers. In addition, studies of high resolution images have indicated the presence of mainly ceria crystallized nanoparticles. Energy electron loss spectroscopy measurements were also performed in scanning mode to study the evolution of the cerium valence. In addition to Ce4+ inside the layer, the presence of amorphous cerium silicate with valence +3 is pointed out at the vicinity of the substrate.