6533b86efe1ef96bd12cc777

RESEARCH PRODUCT

Structural and Chemical Characterization of Cerium Oxide Thin Layers Grown on Silicon Substrate

Jaroslava LavkovaJaroslava LavkovaVladimír MatolínIva MatolínováMartin DubauSylvie BourgeoisValérie Potin

subject

Cerium oxideCeriumMaterials scienceValence (chemistry)Thin layersSiliconchemistryChemical engineeringTransmission electron microscopyElectron energy loss spectroscopyInorganic chemistrychemistry.chemical_elementAmorphous solid

description

In this study, we report transmission electron microscopy and electron energy loss spectroscopy study of cerium oxide thin layers deposited on silicon substrate. Transmission electron microscopy experiments have revealed the flat morphology of the deposited layers. In addition, studies of high resolution images have indicated the presence of mainly ceria crystallized nanoparticles. Energy electron loss spectroscopy measurements were also performed in scanning mode to study the evolution of the cerium valence. In addition to Ce4+ inside the layer, the presence of amorphous cerium silicate with valence +3 is pointed out at the vicinity of the substrate.

yearjournalcountryeditionlanguage
2015-01-01Materials Today: Proceedings
https://doi.org/10.1016/j.matpr.2015.04.014