0000000000462062

AUTHOR

Pierre Wang

showing 2 related works from this author

Effects of high-energy electrons in advanced NAND flash memories

2016

We study the effects of high-energy electrons on advanced NAND Flash memories with multi-level and single-level cell architecture. We analyze the error rate in floating gate cells as a function of electron energy, evaluate the impact of total ionizing dose, and discuss the physical origin of the observed behavior.

NeutronsHigh energyRadiationElectron energy010308 nuclear & particles physicsComputer sciencebusiness.industryNAND gateAlpha Particles; Flash; Neutrons; Radiation Effects; Single Event Upset; Electrical and Electronic Engineering; RadiationElectronAlpha Particles01 natural sciencesThreshold voltageRadiation EffectsFlash (photography)Error analysisAbsorbed dose0103 physical sciencesElectronic engineeringOptoelectronicsElectrical and Electronic EngineeringFlashbusinessSingle Event Upset2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

2021

International audience; Functional verification schemes at a level different from component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Despite the promising potential, system-level radiation testing can be applied to the functional verification of systems under restricted intrinsic boundaries. Most of them are related to the use of hadrons as opposed to heavy ions. Hadrons are preferred for the irradiation of any bulky system, in general, because of their deeper penetration capabilities. General guidelines about the test preparation and procedure for a high-level radiation test ar…

Small satelllitessmall satellitesComputer scienceRadiation effects02 engineering and technologytest methodology01 natural sciencesSpace missionsSpace explorationsystem-level testing0202 electrical engineering electronic engineering information engineeringRadiation hardeningTechnik [600]Reliability (statistics)avaruustekniikka[PHYS]Physics [physics]protonselektroniikkalaitteetrisk acceptance[PHYS.PHYS.PHYS-SPACE-PH]Physics [physics]/Physics [physics]/Space Physics [physics.space-ph]Commercial off-the-shelf (COTS)Test (assessment)facilitiesPerformance evaluationTotal ionizing doseSystem verificationtestmethodologyNuclear and High Energy Physicstotal ionizing dose (TID)0103 physical scienceselektroniikkaRadiation hardening (electronics)Electrical and Electronic Engineeringsingle-event effect (SEE)Functional verification010308 nuclear & particles physics600: Technikneutrons020206 networking & telecommunicationsTest methodSystem level testingReliability engineering[SPI.TRON]Engineering Sciences [physics]/ElectronicsNuclear Energy and EngineeringtestausmenetelmätsäteilyfysiikkaOrbit (dynamics)radiation hardness assurancejärjestelmätddc:600
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