0000000000465266
AUTHOR
Sergii Skakun
The ARYA crop yield forecasting algorithm: Application to the main wheat exporting countries
Abstract Wheat is the most important commodity traded in the international food market. Thus, accurate and timely information on wheat production can help mitigate food price fluctuations. Within the existing operational regional and global scale agricultural monitoring systems that provide information on global crop yield and area forecasts, there are still fundamental gaps: #1. Lack of quantitative Earth Observation (EO) derived crop information, #2. Lack of global but detailed (national or subnational level) and timely crop production forecasts and #3. Lack of information on forecast uncertainties. In this study we present the Agriculture Remotely-sensed Yield Algorithm (ARYA) an EO-base…
Forecasting Wheat Yield Using Remote Sensing: The ARYA Forecasting System
In this study we present a model to forecast wheat yield based on the evolution of the Difference Vegetation Index (DVI) and the Growing Degree Days (GDD), presented in Franch et al. (2015), but adapted to Franch et al. (2019) model. Additionally, we explore how the Land Surface Temperature (LST) can be included into the model and if this parameter adds any value to the model when combined with the optical information. This study is applied to MODIS data at 1km resolution to monitor the national and state level yield of winter wheat in the United States and Ukraine from 2001 to 2019.
Evaluation of the AVHRR surface reflectance long term data record between 1984 and 2011
Abstract The long-term data record (LTDR) from the Advanced Very High-Resolution Radiometer (AVHRR) provides daily surface reflectance with global coverage from the 1980s to present day, making it a unique source of information for the study of land surface properties and their long-term dynamics. Surface reflectance is a critical input for the generation of products such as vegetation indices, albedo, and land cover. Therefore, it is of utmost importance to quantify its uncertainties to better understand how they might propagate into downstream products. Due to the prolonged length of the surface reflectance LTDR and previous unavailability of a well calibrated reference, no comprehensive …