0000000000496532
AUTHOR
Paul O'connor
Lateral diffusion estimation in fully depleted thick CCD using flat field image analysis
Abstract In thick fully depleted CCDs charge carrier transport from the back window to the gates is accompanied by charge diffusion. Lateral diffusion smooths out density variations of the incoming photon flux by redistributing charges spatially. This creates short range positive correlations in recorded amplitudes. Pixel-to-pixel amplitude variations can also be caused by pixel size and quantum efficiency variations. Pixel size variations result in short range negative correlations. Our study shows that the characteristic diffusion width can be extracted from flat field data. The study was performed on fully depleted, thick CCDs produced in a technology study for the Large Synoptic Survey …
CCD characterization and measurements automation
Abstract Modern mosaic cameras have grown both in size and in number of sensors. The required volume of sensor testing and characterization has grown accordingly. For camera projects as large as the LSST, test automation becomes a necessity. A CCD testing and characterization laboratory was built and is in operation for the LSST project. Characterization of LSST study contract sensors has been performed. The characterization process and its automation are discussed, and results are presented. Our system automatically acquires images, populates a database with metadata information, and runs express analysis. This approach is illustrated on 55 Fe data analysis. 55 Fe data are used to measure …