0000000000496745
AUTHOR
M. Svilans
EFFECTS OF THE MULTIPLE INTERNAL REFLECTION AND SAMPLE THICKNESS CHANGES ON DETERMINATION OF ELECTRO-OPTIC COEFFICIENT VALUES OF A POLYMER FILM
New nonlinear optical (NLO) active organic materials are appealing candidates for optoelectronic and photonic technologies. For the evaluation of new NLO polymer materials for applicability in the mentioned technologies, the most important criteria are their electro-optic (EO) coefficients. We have implemented the Mach–Zehnder interferometric (MZI) method for the determination of EO coefficients of thin organic films. Despite the fact that other multiple optical methods for the determination of thin film EO coefficients are known, the MZI method has been chosen because this particular technique has high sensitivity to phase and intensity modulations in the sample arm of an interferometer an…
Electrooptic coefficient measurements by Mach Zehnder interferometric method: Application of Abelès matrix formalism for thin film polymeric sample description
Abstract In Mach–Zehnder interferometric (MZI) method for determination of thin organic film electrooptic ( EO ) coefficients r 13 and r 33 critical effects, like multiple internal reflections and sample thickness modulation due to electrostriction and piezoelectricity are usually overlooked. Ignoring these effects may lead to inaccurate calculation of EO coefficients from experimental data by the simplified equations. To describe the influence of the above mentioned effects on the output of a MZI containing a thin film polymer sample we have used the Abeles matrix formalism.