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RESEARCH PRODUCT
Electrooptic coefficient measurements by Mach Zehnder interferometric method: Application of Abelès matrix formalism for thin film polymeric sample description
M. SvilansE. NitissM. Rutkissubject
chemistry.chemical_classificationMaterials scienceElectrostrictionbusiness.industryPolymerMach–Zehnder interferometerPiezoelectricityAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsInterferometryOpticschemistryModulationElectrical and Electronic EngineeringPhysical and Theoretical ChemistryThin filmbusinessPhase modulationdescription
Abstract In Mach–Zehnder interferometric (MZI) method for determination of thin organic film electrooptic ( EO ) coefficients r 13 and r 33 critical effects, like multiple internal reflections and sample thickness modulation due to electrostriction and piezoelectricity are usually overlooked. Ignoring these effects may lead to inaccurate calculation of EO coefficients from experimental data by the simplified equations. To describe the influence of the above mentioned effects on the output of a MZI containing a thin film polymer sample we have used the Abeles matrix formalism.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2013-01-01 | Optics Communications |