0000000000519065
AUTHOR
Michal Borkovec
showing 3 related works from this author
Ion-ion correlation and charge reversal at titrating solid interfaces
2009
Confronting grand canonical titration Monte Carlo simulations (MC) with recently published titration and charge reversal (CR) experiments on silica surfaces by Dove et al. and van der Heyden it et al, we show that ion-ion correlations quantitatively explain why divalent counterions strongly promote surface charge which, in turn, eventually causes a charge reversal (CR). Titration and CR results from simulations and experiments are in excellent agreement without any fitting parameters. This is the first unambiguous evidence that ion-ion correlations are instrumental in the creation of highly charged surfaces and responsible for their CR. Finally, we show that charge correlations result in "a…
Long-ranged and soft interactions between charged colloidal particles induced by multivalent coions
2015
Forces between charged particles in aqueous solutions containing multivalent coions and monovalent counterions are studied by the colloidal probe technique. Here, the multivalent ions have the same charge as the particles, which must be contrasted to the frequently studied case where multivalent ions have the opposite sign as the substrate. In the present case, the forces remain repulsive and are dominated by the interactions of the double layers. The valence of the multivalent coion is found to have a profound influence on the shape of the force curve. While for monovalent coions the force profile is exponential down to separations of a few nanometers, the interaction is much softer and lo…
Forces between colloidal particles in aqueous solutions containing monovalent and multivalent ions
2017
The present article provides an overview of the recent progress in the direct force measurements between individual pairs of colloidal particles in aqueous salt solutions. Results obtained by two different techniques are being highlighted, namely with the atomic force microscope (AFM) and optical tweezers. One finds that the classical theory of Derjaguin, Landau, Verwey, and Overbeek (DLVO) represents an accurate description of the force profiles even in the presence of multivalent ions, typically down to distances of few nanometers. However, the corresponding Hamaker constants and diffuse layer potentials must be extracted from the force profiles. At low salt concentrations, double layer f…