0000000000520224

AUTHOR

Matthias Schreck

showing 2 related works from this author

Diamond nucleation on iridium: local variations of structure and density within the BEN layer

2009

Abstract The diamond nuclei generated by the bias enhanced nucleation (BEN) on iridium are gathered in well defined areas (“domains”). In atomic force microscopy (AFM) measurements they become manifest in a 1 nm downward step. The fine structure of the carbon layer inside and outside these domains has been studied by small spot Auger electron spectroscopy (AES), high resolution transmission electron microscopy (HRTEM), AFM and lateral force microscopy (LFM). The Auger spectra of the carbon KLL peak taken in an ultra high vacuum setup revealed diamond features inside and more graphitic features outside the domains. The comparison with the intensity of the Auger signal originating from the un…

Auger electron spectroscopybusiness.industryMechanical EngineeringUltra-high vacuumNucleationchemistry.chemical_elementDiamondGeneral Chemistryengineering.materialMolecular physicsElectronic Optical and Magnetic MaterialsAugerOpticschemistryTransmission electron microscopyMaterials ChemistryengineeringElectrical and Electronic EngineeringbusinessHigh-resolution transmission electron microscopyCarbon
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Comparative optical reflection and mass spectrometry analysis of thermodesorption of Langmuir-Blodgett films

1992

Abstract Thermodesorption of cadmium arachidate multilayers is studied by optical surface analysis and by mass spectrometry measurements. The optical reflection technique has been improved to discriminate signal contributions from desorption and light scattering. The scattering arises from film heterogeneities that are also observed by Nomarsky microscopy. The assessment of these heterogeneities is important to understand mass spectrometry data. Both the optical technique and mass spectrometry are sensitive to observing the multilayer phase transition at 110 °C and the desorption near 200 °C (at the heating rate applied). The mass spectrometry analysis yields detailed information on the des…

Static secondary-ion mass spectrometryScatteringChemistryMetals and AlloysAnalytical chemistrySurfaces and InterfacesThermal ionization mass spectrometryMass spectrometryLangmuir–Blodgett filmLight scatteringSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsDesorptionMicroscopyMaterials ChemistryThin Solid Films
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