0000000000545541

AUTHOR

Bernard Lamalle

showing 10 related works from this author

Rétine Vidéo Rapide Réalisée en Technologie CMOS

2008

Nous présentons une rétine réalisée en technologie CMOS 0.6 μm dédiée à l’observation de phénomènes lumineux rapides. Le pixel que nous avons conçu est basé sur un principe de modulation de la durée d’une impulsion représentative du flux lumineux incident. Ce pixel a été validé par simulation SPICE grâce aux bibliothèques AMS du fondeur puis dessiné en full- custom de façon à optimiser sa surface, on a obtenu ainsi un pixel dont la dimension est de 49.2μm de coté avec un taux de remplissage de 18 %.

[SPI.OTHER]Engineering Sciences [physics]/Other[SPI.OTHER] Engineering Sciences [physics]/OtherComputingMilieux_MISCELLANEOUS
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Shape Reconstruction of Metallic Objects by Artificial Vision

1997

Quality control in industrial applications has greatly benefited from the development of tools like artificial vision. The artificial vision approach of quality control has the advantage of being able to perform both non-destructive and contactless controls as well as to work mostly in real time. However, in the case of non planar objects to be controlled, dimensional control may become hard to realize. Indeed, due to the bidimensional aspect of the images, a loss of information is unavoidable. Consequently, obtaining depth information from a planar image is not obvious. Most of the existing methods use several cameras1 or several light sources2, this leads to an increase in the processing …

business.industryComputer sciencemedia_common.quotation_subject3D reconstructionGridObject (computer science)Image (mathematics)PlanarArtificial visionQuality (business)Computer visionArtificial intelligenceShape reconstructionbusinessmedia_common
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A Continuous Time Pattern Recognition Retina

2002

International audience; We present in this paper a pattern recognition retina operating in continuous time. During a programming phase, the reference image is acquired by the sensor. After thresholding, the resulting binary image is stored in the sensor's pixels. During the recognition phase, the retina calculates, in an analog way and in continuous time, the zero displacement intercorrelation of the current image with the binary reference image and its complement. These two intercorrelation values are output as currents. By comparing these currents to expected values, determined during the programming phase, a shift of the pattern or a difference between the observed and programmed pattern…

[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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A Correlation Retina in Standard 0.6um : Application in Positioning System

2003

International audience; We have designed and fabricated a programmable retina that is capable of recognizing patterns stored in memory in real-time. Each of the pixels of the retina is composed of a photodiode and an electronic device used during the programming phase to digitize the image of the pattern to recognize into a binary image stored in latches. The array of pixels is thus partitioned into two complementary disjoint sub-sets with all the photodiodes of the same sub-set connected together in order to obtain the sum total of the currents. During the analysis phase, an optical correlation between the projected image and the reference binary image memorized in the circuit is done. The…

Engineering[ INFO ] Computer Science [cs]Positioning systemPixelbusiness.industryBinary imageComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONBinary number02 engineering and technologyPhotodiodelaw.inventionLuminous fluxOpticslawvisual_artElectronic component0202 electrical engineering electronic engineering information engineeringvisual_art.visual_art_medium020201 artificial intelligence & image processingComputer vision[INFO]Computer Science [cs]Artificial intelligenceImage sensorbusiness
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Hardware Computation of Moment Functions in a Silicon Retina Using Binary Patterns

2006

International audience; We present in this paper a method for implementing moment functions in a CMOS retina for shape recognition applications. The method is based on the use of binary patterns and it allows the computation of different moment functions such geometric and Zernike moments of any orders by an adequate choice of the binary patterns. The advantages of the method over other methods described in the literature is that it is particularly suitable for the design of a programmable retina circuit where moment functions of different orders are obtained by simply loading the correct binary patterns into the memory devices implemented on the circuit. The moment values computed by the m…

Zernike polynomialsComputation[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsBinary number02 engineering and technologyMethod of moments (statistics)symbols.namesake[ INFO.INFO-TI ] Computer Science [cs]/Image Processing0202 electrical engineering electronic engineering information engineeringComputer visionPattern matching[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsRepresentation (mathematics)Mathematicsbusiness.industry020206 networking & telecommunicationsMoment (mathematics)[INFO.INFO-TI] Computer Science [cs]/Image Processing [eess.IV][INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]Pattern recognition (psychology)symbols020201 artificial intelligence & image processing[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsArtificial intelligencebusinessAlgorithm
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A CMOS Image Sensor Design for Speed Determination of Fast Moving Luminous Objects

2003

International audience

[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsComputingMilieux_MISCELLANEOUS
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Dimensional control of metallic objects by artificial vision: contribution to lighting condition studies

1999

We present an original method that enables real time automatic dimensional control of defects on metallic objects. The method is based on the theoretical and experimental study of light reflection mechanisms that can be seen as a function of the surface roughness and of the light source size. We show that it is possible to reconstruct the profile of an object from a single gray level image. An industrial application enables us to validate our results. Finally, an error computation fixes the limits of our method and enables us to better understand illumination problems.

Machine visionComputer sciencebusiness.industryOptical engineeringGeneral EngineeringFunction (mathematics)Object (computer science)Atomic and Molecular Physics and OpticsSurface roughnessReflection (physics)Computer visionArtificial intelligenceControl (linguistics)businessOptical Engineering
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Study of the imaging conditions and processing for the aspect control of specular surfaces

2001

A vision system capable of imaging and detecting defects on reflective nonplanar surfaces in the production line at a high cadence is presented in this paper. Defects are typically dust located under the metallic layer of packaging products used in cosmetic industries. To realize this processing, structured lighting which reveals the defects in the image is proposed. Defects appear clearly in the images like a set of brilliant pixels in dark zones. The signature of the defect is then obtained. The size of this signature does not depend linearly on the size of the defect. It is a function of the observation angle. In order to realize a precise and robust process, the necessity of acquiring s…

Production linePixelComputer sciencebusiness.industryMachine visionProcess (computing)Image processingAtomic and Molecular Physics and OpticsSignature (logic)Computer Science ApplicationsComputer data storageComputer visionSpecular reflectionArtificial intelligenceElectrical and Electronic EngineeringbusinessJournal of Electronic Imaging
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Masquer l'Objet pour Mieux le Reconnaître

2005

National audience; L’évolution des technologies de pointe a repoussé les limites des domaines d’application de l’imagerie numérique de sorte que les capteurs d’images sont aujourd’hui omniprésents dans beau- coup d’applications, que ce soit des applications scientifiques ou des appli- cations liées au divertissement et à un usage grand public. Ces capteurs four- nissent en général une image qui est par la suite traitée par un ordinateur ou des circuits électroniques spécialisés. La course vers la miniaturisation et vers des systèmes autonomes compacts et légers nécessite aujourd’hui des cap- teurs d’images de plus en plus petits et de faible consommation. De plus, il existe des applications…

[ INFO ] Computer Science [cs][INFO]Computer Science [cs][INFO] Computer Science [cs]
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Reconnaissance de la Forme 3D et Estimation de la Profondeur Implémentation sur FPGA Spartan 3A d'un SoC pour la Vision 3D (Shape From Focus) Problém…

2007

Le terme de « vision 3D » ou « de numérisation 3D », est apparu à la fin des années 1990, pour désigner des techniques d'acquisition de mesures tridimensionnelle sur des surfaces, techniques ayant la caractéristique de donner des nuages de points denses et importants dont l'ordre de grandeur est de quelques dizaines à plusieurs millions de points. Le nuage de points représente en fait l'information de l'image de profondeur et selon des différents traitements à l'image on peut aboutir à un ordre de précision de la reconstitution de l'objet ou scène en 3D. La vision 3D demeure une méthodologie de base pour réassurer le mécanisme de reconstitution des images tridimensionnelles. Outre les besoi…

[INFO.INFO-AI] Computer Science [cs]/Artificial Intelligence [cs.AI][INFO.INFO-CV] Computer Science [cs]/Computer Vision and Pattern Recognition [cs.CV][SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.TRON] Engineering Sciences [physics]/Electronics[INFO.INFO-ES] Computer Science [cs]/Embedded Systems[INFO.INFO-PL] Computer Science [cs]/Programming Languages [cs.PL]
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