0000000000589127
AUTHOR
Anthony Boscaro
showing 4 related works from this author
Automatic emission spots identification in static and dynamic imaging by research of local maxima.
2014
International audience
multimodal and multi-criteria analysis for the expertise and locating faults in modern electrical components
2017
The purpose of this manuscript is to exhibit the research work solving the issue of data processing stem from defect localization techniques. This step being decisive in the failure analysis process, scientists have to harness data coming from light emission and laser techniques. Nevertheless, this analysis process is sequential and only depends on the expert’s decision. This factor leads to a not quantified probability of localization. Consequently to solve these issues, a multimodaland multicriteria analysis has been developped, taking advantage of the heterogeneous and complementary nature of light emission and laser probing techniques. This kind of process is based on advanced level too…
Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory
2017
Defect localization in Very Large Integration Cir-cuits (VLSI) requires to use multi-sensor information such aselectrical waveforms, emission microscopy images and frequencymapping in order to detect, localize and identify the failure. Eachsensor provides a specific kind of feature modeling the evidence.Thus, the defect localization in VLSI can be summarized asa problem of data fusion with heterogeneous and impreciseinformation. This study illustrates how to reproduce the humandecision for modeling and fusing the different multi-sensorfeatures by using the Demspter-Shafer theory. We propose notonly an automatic decision rule for mass functions computingbut also confidence intervals to quantif…
Multimodal and multicriteria analysis for VLSI expertises and defects localization
2017
The purpose of this manuscript is to exhibit the research work solving the issue of data processing stem from defect localization techniques. This step being decisive in the failure analysis process, scientists have to harness data coming from light emission and laser techniques. Nevertheless, this analysis process is sequential and only depends on the expert’s decision. This factor leads to a not quantified probability of localization. Consequently to solve these issues, a multimodal and multicriteria analysis has been developped, taking advantage of the heterogeneous andcomplementary nature of light emission and laser probing techniques. This kind of process is based on advanced level too…