6533b861fe1ef96bd12c4a5e

RESEARCH PRODUCT

Multimodal and multicriteria analysis for VLSI expertises and defects localization

subject

description

The purpose of this manuscript is to exhibit the research work solving the issue of data processing stem from defect localization techniques. This step being decisive in the failure analysis process, scientists have to harness data coming from light emission and laser techniques. Nevertheless, this analysis process is sequential and only depends on the expert’s decision. This factor leads to a not quantified probability of localization. Consequently to solve these issues, a multimodal and multicriteria analysis has been developped, taking advantage of the heterogeneous andcomplementary nature of light emission and laser probing techniques. This kind of process is based on advanced level tools such as signal/image processing and data fusion. The final aim being to provide a quantitive and qualitative decision help for the experts.The first part of this manuscript is dedicated to the description of the entire process for 1D and 2D data enhancement. Thereafter, the spatio-temporal analysis of laser probing waveforms will be tackled. Finally, the last part highlights the decision support brought by data fusion.