0000000000610680

AUTHOR

M. Chorro

showing 1 related works from this author

Redox reactions in the Pt/TiO2–WO3/SiO2 planar system

2014

Abstract The thermal behavior of the titanium–tungsten adhesive layer (30–70 at.%) deposited on a SiO2 substrate followed by a thicker Pt layer was investigated. The resulting Pt/TiW/SiO2 planar system was annealed under air or vacuum. Morphological and chemical characterizations at different stages of the annealing, as a function of several parameters such as treatment atmosphere, annealing temperature and thickness of the Pt film were performed through surface science analyses. When annealing under air, even at mild temperature (773 K), the whole interlayer oxidizes while a low amount of tungsten diffuses through platinum film. This phenomenon is related to tungsten oxidation which acts a…

Materials scienceAnnealing (metallurgy)Analytical chemistrychemistry.chemical_elementTungstenCondensed Matter PhysicsRedoxSurfaces Coatings and FilmsOverlayerBarrier layerchemistryThermalAdhesivePlatinumInstrumentationVacuum
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